AIST Nanocharacterization Facility (ANCF)
AIST Nanocharacterization Facility (ANCF)
AIST Nanocharacterization Facility (ANCF), one of AIST’s Open Research Facilities, participates in both TIA, an open innovation hub, and the Advanced Research Infrastructure for Materials and Nanotechnology (ARIM) in Japan sponsored by the Ministry of Education, Culture, Sports, Science and Technology (MEXT). Through these two channels, we respond to a wide range of measurement requests from all over the country.
Advanced Research Infrastructure for Materials and Nanotechnology (ARIM) funded by MEXT
Advanced Research Infrastructure for Materials and Nanotechnology (ARIM) is one of the research projects by Japan’s Ministry of Education, Culture, Sports, Science and Technology (MEXT), which started in FY 2021 under the 10-year-long plan. ARIM is devoted to construct and maintain state-of-theart open facilities for materials processing, measurement and analysis as well as their data collection and utilization system for public share-use, thus playing a key role in "Materials DX Platform" so as to promote Japan's materials innovations. This project utilizes nationwide network of both R&D facilities and highly skilled technical professionals, which was established under the Nanotechnology Platform Project. AIST Nanocharactreization Facility (ANCF) is a member of ARIM, together with AIST Nanoprocessing Facility (NPF), for data acquisition, analysis, and collection of cutting-edge nanometer-scale materials including quantum and electronic materials.
Positron probe microanalyzer (PPMA) | X-ray absorption fine structure spectrometer equipped with a superconducting fluorescence detector (SC-XAFS) |
Visible/near-infrared transient absorption spectrometer(VITA) |
Real surface probe microscope (RSPM) |
Solid-state NMR(SSNMR) | Superconducting scanning electron microscope (SC-SEM) |
National Institute of Advanced Industrial Science and Technology AIST Nanocharacterization Facility (ANCF) Secretariat |