計量標準報告 Vol.3 No.4

Bilateral comparison of pressure sensitivities of laboratory standard microphones between NMIJ and NIMT

Development of an Intensity Stabilized Laser System with Frequency Offset of 9.2GHz

Pitch Measurement of 150 nm 1D-grating Standards Using an Nano-metrological Atomic Force Microscope

Rubidium-stabilized diode laser for high-precision interferometer

Thermal Conductivity and Thermal Diffusivity of Twenty-Nine Liquids: Alkenes, Cyclic (Alkanes, Alkenes, Alkadienes, Aromatics), and Deuterated Hydrocarbons

Hardening Mechanisms of Amorphous / Polycrystalline Nanostructured Multilayer Films: Si₃N₄/CrN and Si₃N₄/TiN

What happens in the annealing of carbon nitride thin films?

Nanoscale structural change in a sputter-deposited SiO₂/a-Si/SiO₂ sandwich

Suppression of interfacial diffusion by a predeposited Hf metal layer on SO₂/Si

A Survey on Time/Frequency Transfer and Dissemination Techniques Using Optical Fiber

A survey on micro metrology for dimensional standard

A survey of a power uprate in a commercial nuclear power plant and a water flow facility for calibration standard

Review of Alternating Current Ratio Standards

Recent progress and future prospects for highly accurate measurement methods in millimeter-wave antenna standards

A survey on RF attenuation standand

A survey of RF & microwave impedance standands

A survey on development and establishment of absorbed dose standands for beta radiaton

A survey on highly sensitive gas analysis for standard gas preparation

A Survey on Measurement Technique to Establish and Supply pH Primary Standard

A survey on speciation reference materials

A Survey on Thickness Measurements and Standards for Ultra-thin Films