12
Vol.5, No.2
August 2006
page 97
研究報告(Research Papers)
イオン注入によるアモルファスシリコンの回復速度の温度依存性評価
Evaluation of the temperature dependency of the reordering rate of implanted amorphous Si
National Institute of Advanced Industrial Science and Technology
National Metrology Institute of Japan
12
Vol.5, No.2
August 2006
page 97
研究報告(Research Papers)
Evaluation of the temperature dependency of the reordering rate of implanted amorphous Si
13
Vol.5, No.2
August 2006
page 105
技術資料(Technical Note)
Uncertainty analysis of radio-frequency noise standard
14
Vol.5, No.2
August 2006
page 111
技術資料(Technical Note)
Voltage ratio system constructed for RF attenuation standard
Working standard for control of attenuation calibrator
15
Vol.5, No.2
August 2006
page 125
技術資料(Technical Note)
Calibration method of "Optical Frequency in Telecom Region" and its uncertainty
16
Vol.5, No.2
August 2006
page 131
技術資料(Technical Note)
Uncertainties and calibration method of 532-nm iodine-stabilized Nd:YAG lasers