Specialized equipment

This laboratory uses STEM equipment to observe interface microstructures and elemental distributions with high precision.
The sum-frequency generation (SFG) instrument non-destructively measures the orientation of interface molecules, enabling molecular-level analysis of adhesion reactions.
Stress-induced luminescence technology visualizes dynamic strain distributions and is internationally standardized.
The Near-Atmospheric Pressure X-ray Photoelectron Spectroscopy (NAPXPS) system enables XPS measurements of solid surfaces undergoing chemical state changes in real environments and of liquid samples.
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STEM device

The STEM device is a high-resolution electron microscope capable of analyzing the internal structure and composition of materials at the nanometer scale. Through scanning transmission observation, it enables detailed visualization of atomic arrangements, precipitates, and defect structures within bonding interfaces and thin-film materials. Combined with energy-dispersive X-ray spectroscopy (EDS), it quantitatively evaluates elemental distribution, aiding in elucidating interface reactions and material degradation mechanisms.

POINT01: Observation of fine structures at the atomic level

POINT02: Analyze element distribution at high resolution

POINT03: Detailed understanding of defects and precipitates

POINT04: Utilization for elucidating the mechanisms of interfacial reactions

Harmonic and Frequency Analysis (SRG) Device

Sum Frequency Generation (SFG) spectroscopy is a highly sensitive optical technique that enables non-destructive observation of molecular orientation and chemical structure specific to solid surfaces and interfaces. It analyzes sum frequency signals obtained by simultaneously irradiating infrared and visible light to detect the arrangement state of surface molecules and changes in functional groups. This technique allows for molecular-level understanding of the initial stages of adhesion and interfacial reactions.

POINT01: Non-destructive observation of surface molecular orientation

POINT02: High-sensitivity detection of functional group changes

POINT03: Understanding interfacial chemical reactions at the molecular level

POINT04: Ideal for thin film and adhesive interface evaluation

Harmonic and Frequency Analysis (SRG) Device

Stress-induced luminescence technology

Stress luminescence is a technology that visualizes dynamic strain distribution by applying special coatings or sheets. This enables the detection of fracture initiation points and bonding defects. It also allows for accurate crack tracking in DCB and DNF tests used to determine fracture toughness (G1c, C2c). Its international standardization has led to its adoption worldwide.

POINT01: Visualization of dynamic strain distribution

POINT02: Effective for detecting points of failure, poor adhesion, etc.

POINT03: Proven track record in simulation enhancement

POINT04: Enabling automated crack propagation tracking

Near-Atmospheric Pressure X-ray Photoelectron Spectroscopy (NAPXPS) System

Near-ambient pressure X-ray photoelectron spectroscopy (NAPXPS) equipment enables XPS measurements on sample surfaces under near-ambient pressure conditions, which cannot be achieved with conventional XPS systems. By irradiating the sample surface with X-rays and detecting the emitted photoelectrons with a detector, the chemical states of each element can be investigated. The capability to perform XPS measurements at near-ambient pressure enables the study of chemical state changes occurring on solid surfaces in real-world environments and allows XPS measurements on liquid samples.