Equipments
-
MLA Mineral Liberation Analyzer (MLA250F, FEI)
-
FE-EPMA Field Emission Electron Probe Micro Analyzer (JXA-8530F, JEOL Ltd.)
-
XRD powder X-Ray Diffractometer (SmartLab,
Rigaku Co.) -
SEM-EDS Scanning Electron Microprobe with an Energy Dispersive Spectroscopy (JSM-6610LV
and X-Max50, JEOL Ltd. and Oxford Instruments plc, respectively)
-
Laser Raman Spectrometer (NRS5100, JASCO
Co.) -
LA-ICP-MS Inductively Coupled Plasma Mass
Spectrometer with a femtosecond Laser Ablation sample introduction system (IFRIT and Agilent
7500cx, Cyber Laser Inc. and Agilent
Technologies Inc., respectively)
-
MC-ICP-MS high resolution Multicollector
Inductively Coupled Plasma Mass Spectrometer (NEPTUNE plus, Thermo Fisher Scientific Inc.) -
XRF X-Ray Fluorescence spectrometer (ZSX
PrimusⅢ+, Rigaku Co.)
-
High Voltage Pulse Selective Crushing Equipment (SELFRAG Lab, SELFRAG AG)
-
WHIMS Wet High Intensity Magnetic Separators (HIW L4-20K, そERIEZ Magnetics Japan Co. Ltd.)