2023.6.7
Developmental framework of line edge roughness reference standards for next-generation functional micro-/nanostructures (Precision Engineering)
2023.5.16
Photoresist shrinkage observation by a metrological tilting-AFM (Proc. SPIE)
2023.5.1
The page of "Member" has been updated due to personnel changes.
2023.4.3
The page of "Member" has been updated due to personnel changes.
2023.3.17
Tellurium Nanorods Produced by the Reduction of Tellurate and Tellurite Inside Unicellular Algae (Chemistry Letters)
2023.2.14
Enhancing the precision of 3D sidewall measurements of photoresist using atomic force microscopy with a tip-tilting technique (Journal of Applied Physics)
2022.12.14
Pitch calibration of standard nanoscale for uncertainty reduction of certified reference materials for SEM image sharpness evaluation and magnification calibration (Surface Topography: Metrology and Properties)
2022.11.14
Formation of biogenic tellurium nanorods in unicellular green alga Chlamydomonas reinhardtii (Metallomics)
2022.11.1
The page of "Member" has been updated due to personnel changes.
2022.10.3
The page of "Member" has been updated due to personnel changes.
2022.7.1
The page of "Member" has been updated due to personnel changes.
2022.6.1
Unbiased line edge roughness measurement using profile-averaging method for precise roughness parameters measurement (J. of Micro/Nanopatterning, Materials, and Metrology)
2022.5.6
Effect of specimen processing for transmission electron microscopy on lattice spacing variation in Si specimens (Ultramicroscopy)
2022.4.1
The page of "Member" has been updated due to personnel changes.
2022.2.3
Application of NMIJ CRM 5207-a Tungsten Dot-array:
Reliable Evaluation of the Lateral Resolution of a Confocal Raman Microscope by Using the Tungsten-dot Array Certified Reference Material (Analytical Sciences)
2021.12.16
Formation Mechanism and Toxicological Significance of Biogenic Mercury Selenide Nanoparticles in Human Hepatoma HepG2 Cells (Chem. Res. Toxicol.)
2021.11.18
Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan (Nanomanufacturing and Metrology)
2021.11.1
The page of "Member" has been updated due to personnel changes.
2021.10.1
The page of "Member" has been updated due to personnel changes.
2021.9.22
Extension of the probe-tip error evaluation for areal surface roughness measurements using metrological AFM (Measurement: Sensors)
2021.9.2
Chromogenic Amorphous MoO3–x Nanosheets and Their Nanostructured Films for Smart Window Applications (ACS Applied Nano Materials)
2021.9.1
"Development of a metrological atomic force microscope with a tip-tilting mechanism for 3D nanometrology (Measurement Science and Technology)" was cited 9 times in 2020. This is well above the average, and helped drive the journal's Impact Factor to it's second-highest. The IOP publisher showed their appreciation for submitting high impact measurement research to the journal.
2021.8.2
The page of "Member" has been updated due to personnel changes.
2021.7.1
Kobayashi's web page has been opened.
2021.5.25
Experimental evaluation of uncertainty in sub-nanometer metrology using transmission electron microscopy due to magnification variation (Measurement Science and Technology)
2021.5.21
2021.4.1
The pages of "Member" and "Article" have been updated due to personnel changes.
2021.3.10
Evaluating SEM-based LER metrology using a metrological tilting-AFM (SPIE Proceedings)
2021.1.27
Evaluation of Image Distortion in SEM by Using a Dot-Array Based Certified Reference Material (Microscopy)
2021.1.7
"Line edge roughness measurement on vertical sidewall for reference metrology using a metrological tilting atomic force microscope (J. of Micro/Nanolithography, MEMS, and MOEMS)" is one of the papers with many downloads in 2020. Editor-in-Chief of the Journal showed his appreciation for submitting a good quality paper to the journal.
2020.11.13
Direct comparison of line edge roughness measurements by SEM and a metrological tilting-atomic force microscopy for reference metrology (J. of Micro/Nanolithography, MEMS, and MOEMS)
2020.10.16
Development of NMIJ CRM 5207-a tungsten dot-array for the image sharpness evaluation in scanning electron microscopy – structure evaluation and determination of dot-pitch (Microscopy)
2020.8.24
Elucidation of tellurium biogenic nanoparticles in garlic, Allium sativum, by inductively coupled plasma-mass spectrometry (Journal of Trace Elements in Medicine and Biology)
2020.7.6
"Characterization of the Volume-based or Number-based Size Distribution for Silica Nanoparticles Using a Unique Combination of Online Dynamic Light Scattering Having a Uni-tau Multi-bit Correlator and High-resolution Centrifugal Field-Flow Fractionation Separator (Analytical Sciences)" was selected as one of Hot Articles − Volume 36, Number 6 (2020)
2020.5.13
A standard used for probe-tip diameter evaluation in surface roughness measurements using metrological atomic force microscope (Measurement Science and Technology)
2020.4.20
Line edge roughness measurement on vertical sidewall for reference metrology using a metrological tilting atomic force microscope (J. of Micro/Nanolithography, MEMS, and MOEMS)
2020.4.1
The Nanodimensional Standards Group was launched.
