Nanodimensional Standards Group

2024.1.31
Uptake and accumulation mechanisms of hexachloroplatinate(IV) ions in the unicellular alga, Pseudococcomyxa simplex (Metallomics)

2023.12.8
Evaluation of the change in photoresist sidewall roughness due to electron beam-induced shrinkage using atomic force microscopy (J. of Micro/Nanopatterning, Materials, and Metrology)

2023.10.31
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV (Ultramicroscopy)

2023.10.12
A link in the page of "Member" was amended .

2023.10.2
The page of "Member" has been updated due to personnel changes.

2023.9.13
Contrast mechanism at landing energy near 0 eV in super low-energy scanning electron microscopy (Microscopy)

2023.7.19
Effect of white noise on roughness measurements of self-affine fractals (Measurement Science and Technology)

2023.6.7
Developmental framework of line edge roughness reference standards for next-generation functional micro-/nanostructures (Precision Engineering)

2023.5.16
Photoresist shrinkage observation by a metrological tilting-AFM (Proc. SPIE)

2023.5.1
The page of "Member" has been updated due to personnel changes.

2023.4.3
The page of "Member" has been updated due to personnel changes.

2023.3.17
Tellurium Nanorods Produced by the Reduction of Tellurate and Tellurite Inside Unicellular Algae (Chemistry Letters)

2023.2.14
Enhancing the precision of 3D sidewall measurements of photoresist using atomic force microscopy with a tip-tilting technique (Journal of Applied Physics)

Topics in the past.