|Nanoscale Standards by Metrological AFM and Other Instruments (IOP ebooks)|
The pages of "Member" and "Article" have been updated due to personnel changes.
"Line edge roughness measurement on vertical sidewall for reference metrology using a metrological tilting atomic force microscope (J. of Micro/Nanolithography, MEMS, and MOEMS)" is one of the papers with many downloads in 2020. Editor-in-Chief of the Journal showed his appreciation for submitting a good quality paper to the journal.
"Characterization of the Volume-based or Number-based Size Distribution for Silica Nanoparticles Using a Unique Combination of Online Dynamic Light Scattering Having a Uni-tau Multi-bit Correlator and High-resolution Centrifugal Field-Flow Fractionation Separator (Analytical Sciences)" was selected as one of Hot Articles − Volume 36, Number 6 (2020)