2026.5.19
New NMIJ CRM 5209-a TaN Dot-array was launched.

2026.5.11
New dynamic Zimm-type plot on light scattering measurement for evaluating interaction changes due to salt addition to particle dispersions (Next Materials)

2026.4.8
LER analysis of noisy SEM images using physics-inspired deep learning (Proc. SPIE)

2026.4.1
The page of "Members" was updated due to personnel changes.

2026.3.27
The paper written by Dr. Kizu and Dr. Kobayashi was selected as the best published in 2025 for the Precision Measurement section by Measurement Science and Technology, IOP Publishing

2025.12.8
Nanostructural Evolution in Stainless Steel fabricated by Laser-based Powder Bed Fusion: A Combined SEM/EDX and Positron Lifetime Study (Journal of Physics: Conference Series)

2025.11.11
Abbe error correction in atomic force microscopy using scanner-angle measurements (Measurement Science and Technology)

2025.10.20
Unveiling precision and limitations in submicron particle size analysis methods: EM, LD, and DLS (Powder Technology)

2025.10.7
Distribution measurement of line edge roughness using a noise correction based on height–height correlation function (Journal of Micro/Nanopatterning, Materials, and Metrology)

2025.7.14
Macroscopic environmental heterogeneity and corrosion behavior derived from in vitro degradation of pure magnesium and their in vivo investigation (Journal of Magnesium and Alloys)

2025.7.9
A practical method for performing full-tilt-angle electron tomography of submicron-sized particles (Micron)

2025.7.9
Structural evolution during sintering of additively manufactured stainless-steel objects through electron microscopy and positron annihilation lifetime measurements (Journal of Physics: Conference Series)

2025.6.4
Evolution of Nanocavities to Ductile Fractures in Crustal-Scale Faults at the Base of the Seismogenic Zone (Journal of Geophysical Research: Solid Earth)

2025.5.2
Comparing bottom–up and top–down SI traceability approaches in dimensional nanometrology: reference material measurements using transmission electron microscopy and atomic force microscopy (Measurement Science and Technology)

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