ŽY‹Ζ‹Zp‘‡Œ€‹†Š‚Μƒz[ƒ€ƒy[ƒW‚Φ–ί‚ι

3rd International PV Module Quality Assurance Forum

- Simulataneous Translation (English-Japanese) available -

Date: Nov. 27(Thu), 2012

Venue: IINO Hall Conference Center, Tokyo, Japan@

Thank you for your participation.

Presentation materials are avialble (Nov. 30).

International PV Module QA Forum was initiated last July in San Francisco, CA, USA, as an international platform to discuss PV Module Quality Assurance issues and create a QA rating system to differentiate the relative durability of module designs and a guideline for factory inspections of the QA system used during manufacturing. Participants agreed to form Task Groups to tackle 5 key issues with higher priority.
2nd International Meeting was held last December at Sheraton Tokyo Miyako hotel in Tokyo quite successfully with more than 200 attendees from various regions of the world.
As of today, over 300 volunteers participate 9 Task Group to develop This year, 3rd International Meeting is planned to review needs for Module QA and update each Task Group to discuss and prioritize issues based on input from stakeholders of different interests, not only from scientists and engineers but also from business executives.

The detailed agenda and presentations made over the two days are available on the forum websites in English and Japanese;

Organizing Committee Chairs

AIST Ph.D.  Michio Kondo
NREL Principal Scientist  Ph.D. Sarah Kurtz
EU_DG_JRC  Ph.D. Tony Sample

Sponsored by

Photovoltaic Power Generation Technology Research Association (PVTEC)

Co-Sponsored by

National Institute of Advanced Industrial Science and Technology (AIS)@
NREL(National Renewable Energy Laboratory)

Supported by

DOE(United States Department of Energy)@
European Commission Joint Research Centre
Japan Electrical Testing Laboratories (JET)
The Japan Electrical Manufacturers' Association (JEMA)  
Japan Photovoltaic Energy Association (JPEA)

Venue

Access to IIno Hall

 

Agenda (Tentative)

9:30  Registration
10:00   Opening
           Michio Kondo(AIST, Organizing committee chair)
           Sarah Kurtz(NREL, Organizing committee chair)

          Welcome:
                 Rhoji Doi(METI)
                 Jeffrey Miller(DOE/US Embassy to Japan)
                Hiromu Takatsuka(PVTEC)

10:40  Session I.  Special Talk

10:40  Presentation topic (tbd)|Dr.Heinz Ossenbrink(EU_DG_JRC)

11:10  Presentation topic (tbd)|Dr.Thomas Reindl (SERIS)

11:40 Outline of newly started Japanese FIT program|Keisuke Murakami(METI)

12:10  Session ll.  FIT and Bankability session
As the community increases investment in PV systems, many are asking how to assure that the PV module design will be durable in their application/location and how to assure that the manufacturing process is adequately controlled. This session will explain JIS Q8901 which specifies requirements for reliability of PV module as well as financial institutes’ perspectives on PV Quality Assurance needs and challenges.

12:10  JIS Q8901 and its certification|Katsuaki Shibata (JET)

12:30  Bankability” of PV project|Teiko Kudo (SMBC)

12:50  Discussion

13:00  Lunch

14:00  Session lll  Technical session
        Many laboratories have been developing new tests for PID. This session will describe some of the tests that have been proposed and suggest how they may be useful toward defining comparative tests to differentiate products for different locations/applications. Also thin film PV module reliability issue will be presented to lead discussion on scope and major activities of TG8 Task Group.

14:00  Potential Induced Deterioration(PID)]Dr. Juliane Berghold (PI-Berlin)

14;20  PID Testing|Dr.Tadanori Tanahashi(Espec)

14:40  Thin film PV module reliability|Dr.Neelkanth Dhere(FSEC)

15:00  Discussion

15:20  Coffee Break

15:40  Session lV.  Task Group update
 In this session, representative from each Task Group (TG1-5 and TG8) will report on
 the Group as well as remaining challenges and timeline for development
Open discussion will ask participants to suggest how comparative tests may be defined to quantify the effects of various stresses on the prioritized failure mechanisms or to define the tests that are needed for quality control during the manufacturing process.

15:40  Update of QA Forum efforts and its future perspective|Sarah Kurze(NREL)
16:00  Update of TG1-5 & 8|Japan TG leader
16:00 Task Group 1
16:10 Task Group 2
16:20 Task Group 3
16:30 Task Group 4
16:40 Task Group 5
16:50 Task Group 8
17:00  Open discussion

17:40   Closing Remarks
17:50   Adjourn


Registration:@Closed on Tuesday, Nov. 20

Contact: PVTEC@Hiroko Saito
              Phone: +81-3-3222-5551AMail:@pvtec-jimu@pvtec.or.jp

 

This program is supported by folowing companies and organizations.

JET UL ESPEC
ƒpƒiƒ\ƒjƒbƒN TORAY Kyocera
mitsubisi USHIO VDE
CIC  Dupont
Sharp SNK TorayDow
TEL TOYOBO Kaneka
SolarFronteer AGC

@@@

 

  ‚²—˜—pπŒ  |  ŒΒlξ•ρ•ΫŒμ ©ŽY‘Œ€