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Papers for IWSSD2016 can be submitted to a special issue of the IOP journal, Superconducting Science and Technology (SUST).  The title of the special issue is “Focus on Low and High-Tc Superconducting Sensors and Detectors.” The information of the SUST special issues can be found in the SUST home page.

The paper submission dead line is on January 14 2017. There is no page limit.

Papers for the special issue will be nominated by the guest editors, M. Ohkubo of AIST, Yong-Hamb Kim of KRISS, and Lixing You of CAS-SIMIT during the workshop. Those of you who plan to submit your papers to the special issue, please send an e-mail message to iwssd2016_info@aist.go.jp.

The scope of the special issues, "Focus on Low and High-Tc Superconducting Sensors and Detectors," is as follows.

"Superconductivity is an essential tool for sensing fields and detecting quanta. Josephson effects, Meissner effects, ultrasmall energy gaps, extremely-sharp normal-superconducting transition, and strong electron-phonon coupling possessed by low and high Tc materials can be used to realize unconventional sensors and detectors. This focus issue covers device physics, fabrication, performance, and applications to many fields. It includes papers presented at IWSSD2016, in addition; leading researchers will also be invited to contribute and there will be an open call for submissions within this scope."

The outline of the SUST special issues is  "Each special issue collection serves to highlight the exciting work conducted in specific areas of interest as identified by the Editorial Board. From this volume onwards, special issue articles accepted for publication in Superconductor Science and Technology will be published earlier - this is different to previous special issues in SUST, where the last paper submitted could delay the entire issue. Instead of being published in a single dedicated issue, these articles will be aggregated into an online collection. We believe this offers a significant improvement to the service we provide to authors invited to submit to these special issues.” Please visit the SUST special issue site for more information.