Fine-structure visualization for materials science research and applications

Various properties and functions of materials are closely related to their fine structures. Developing fundamental techniques for precisely visualizing fine structures is crucial for accelerating the industrial application of newly developed materials by exploiting their excellent properties. We aim to elucidate various structures, such as semiconducting atomic layers, battery materials, molecules, and polymers, using transmission electron microscopy optimized for very thin materials. A comprehensive understanding of the properties and functions of new materials based on atomic-scale images is expected to promote their future application.

Development of fundamental characterization techniques

As various new materials with highly controlled fine structures are being developed, techniques that can evaluate both local structures and physical properties are in increasing demand. To facilitate the future industrial application of new materials, we aim to develop fundamental characterization techniques based on transmission electron microscopy and electron spectroscopy. We have developed techniques to observe lattice vibrations and identify carbon isotopes of graphene at the single-atom level. We aim to incorporate informatics, such as remote operation, automation, and machine learning, into fine-structure characterization through collaborative projects both inside and outside AIST.

• Leader, Group

  Yuta SATO

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• Senior Researcher

  Masanori KOSHINO

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  HP

• Senior Researcher

  Chisato TAKAHASHI

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• Senior Researcher

  Ryosuke SENGA

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• Senior Researcher

  Yung Chang LIN

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• Senior Researcher
  Research Institute for Sustainable Chemistry

  Naoto KAMIUCHI

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• Senior Researcher
  Research Strategy Planning Department Collaboration Promotion Planning Office

  Toshitaka KUBO

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