"Development of an aquatic exposure assessment tool AIST-SHANEL in Japan

Yuriko Ishikawa1, Akihiro Toukai1, Tomoya Kawaguchi2, Mituo Shirahama2, Junko Nakanishi1

1National Institute of Advanced Industrial Science and Technology
2NIHON SUIDO CONSULTANTS CO., LTD.   

SETAC Europe 15th Annual Meeting  (LilleiFrancej 2005/5/25)


Abstract

The AIST-Standardized Hydrology-Based Assessment Tool for Chemical Exposure Load (AIST- SHANEL) model has been developed to estimate daily exposure concentration at 1-km mesh by entering PRTR emission data, climatic, geographical, sewage and industrial statistics for the water system concerned. With these models, it has become possible to easily acquire information about sites of outstanding emission in a river basin, correlation between emission level and exposure concentration, fall in exposure concentration in proportion to river flow, and so on.
Furthermore, the impact to the ecological system, and hence, the ecological risk can be assessed by estimating the probability of exceeding the exposure concentration affecting the eco- system. Should there be a strong need for reducing the ecological risk, it would be possible to estimate, through simple data input, how the concentration level of chemicals is changed by the suppression of emission from factories and the improvement of elimination at the sewage. 
The achievements will open the way to solve the problem what measures to take for the part of enterprises releasing chemicals, local municipalities managing the river basin, as well as the general public concerned of the ecological risk.
The subsequent efforts will be paid to the model extension to Japanese major broad-basin water system and second-grade river systems where the exposure level is readily affected by local emission, and the results will be published as AIST-SHANEL Ver. 1.0.

Keywords

Watershed model, Exposure concentration of chemicals, Ecological risk, Risk management


Research Center for Chemical Risk Management 

National Institute of Advanced Industrial Science and Technology