Positron-Annihilation Induced Auger Electron Spectroscopy (PAES)

Characterization of the topmost surface layer

• High sensitivity to the top surface layer
• Elimination of the backgroung of the secondary electrons　
• Reduction of the beam-induced damage

TOF-PAES, AES, XPS, LEED

Recent publication
T. Ohdaira and R. Suzuki, "Positron-Annihilation Induced Auger Electron Spectroscopy" in "Surface Analysis by Auger and X-ray Photoelectron Spectroscopy", (IMPublication 2003).

Links
University of Texas, PAES group
Surface Science Techniques - PAES